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Bougainvillea Comm. ex Juss. is one of the renowned genera in the Nyctaginaceae, but despite its recognized horticultural value, the taxonomy and phylogeny of the genus is not well-studied. Phylogenetic reconstructions based on plastid genomes showed that B. pachyphylla and B. peruviana are basal taxa, while B. spinosa is sister to two distinct clades: the predominantly cultivated Bougainvillea clade (B. spectabilis, B. glabra, B. arborea, B. cultivar, B. praecox) and the clade containing wild species of Bougainvillea (B. berberidifolia, B. campanulata, B. infesta, B. modesta, B. luteoalba, B. stipitata, and B. stipitata var. grisebachiana). Early divergence of B. peruviana, B. pachyphylla and B. spinosa is highly supported, thus the previously proposed division of Bougainvillea into two subgenera (Bougainvillea and Tricycla) was not reflected in this study. Morphological analysis also revealed that leaf arrangement, size, and indumentum together with the perianth tube and anthocarp shape and indumentum are important characteristics in differentiating the species of Bougainvillea. In the present study, 11 species and one variety are recognized in Bougainvillea. Six names are newly reduced to synonymy, and lectotypes are designated for 27 names. In addition, a revised identification key and illustrations of the distinguishing parts are also provided in the paper. 

Abstract System reliability is quantified by the probability that a system performs its intended function in a period of time without failures. System reliability can be predicted if all the limit-state functions of the components of the system are available, and such a prediction is usually time consuming. This work develops a time-dependent system reliability method that is extended from the component time-dependent reliability method using the envelope method and second-order reliability method. The proposed method is efficient and is intended for series systems with limit-state functions whose input variables include random variables and time. The component reliability is estimated by the second-order component reliability method with an improve envelope approach, which produces a component reliability index. The covariance between component responses is estimated with the first-order approximations, which are available from the second-order approximations of the component reliability analysis. Then, the joint distribution of all the component responses is approximated by a multivariate normal distribution with its mean vector being component reliability indexes and covariance being those between component responses. The proposed method is demonstrated and evaluated by three examples. 

This paper presents a modeling and uncertainty quantification (UQ) study of the photoelectron sheath near the lunar surface. A fully kinetic 3-D finite-difference (FD) particle-in-cell (PIC) code is utilized to simulate the plasma interaction near the lunar surface and the resulting photoelectron sheath. For the uncertainty quantification analysis, this FD-PIC code is treated as a black box providing high-fidelity quantities of interest, which are also used to construct efficient reduced-order models to perform UQ analysis. 1-D configuration is chosen to present the analytic sheath solution as well as to demonstrate the procedure and capability of the UQ analysis.